自动基线拟合累积量算法纳米颗粒反演

Baseline Auto-fitting with Cumulant Analysis for Nano-particle

传统累积量反演算法是一种经典的纳米颗粒反演算法,但是利用传统累积量算法对颗粒粒径进行计算时基线值的不同会影响颗粒粒径信息。提出采用一种自动基线拟合的累积量算法,此方法利用光子相关光谱函数作为目标函数进行反演,直接拟合基线值及颗粒粒径信息。利用光子相关光谱实验台对90nm的乳胶颗粒进行了测试并采用以上两种累积量算法进行数据处理,实验结果表明采用传统累计量算法,由于基线值的不同和噪声的影响,其结果受相关时间影响较大,而采用本文自动基线拟合累积量方法,其测量结果其稳定性好,基本不受相关时间影响。

The method of traditional cumulant is a standard technique used to analyze dynamic light-scattering data. However, the different baseline values influence the results measured by using dynamic light-scattering. A method of moment-cumulant, which fits the baseline automatically, is proposed. The correlation function is used as the model function to inverse the particle diameter and distribution factor pi directly. An experiment is done with latex particle of 90 nanometers in laboratory. Compared with the two cumulant models, it is shown that the particle diameter and particle distribution factor pi are unstable in width fit range and lead to deviation with traditional cumulant, while measurement results is good in stability and not influenced by correlation time with the cumulant method of baseline auto-fitting.