硅陷阱探测器绝对光谱响应率校准实验研究

Experimental Studies on Si Trap Detector Absolute Spectral Responsivity Calibration

以Ar^+Kr^+激光器、He-Ne激光器和半导体泵浦激光器作为光源,利用激光稳功率装置以及闭环机械制冷型低温辐射计,校准了硅陷阱探测器的绝对光谱响应率。在硅探测器的光谱响应范围400～1 100 nm内,选择476.1 nm、488 nm、514.7 nm、521 nm、568 nm、632.8 nm、647.1nm、1064 nm共8条谱线进行了实验研究。实验数据表明,绝对光谱响应率的测量不确定度为可见光波段优于0.02%,1 064 nm波长点优于0.03%。

The absolute spectral responsivity of the Si trap detector is calibrated by laser intensity stabilizer and closed loop refrigeration cryogenic radiometer with Ar^＋ Kr^＋ laser, He Ne laser and PDSS laser. Eight wavelength laser beams of 476.1 nm, 488 nm, 514.7 nm, 521 nm, 568 nm, 632.8 nm, 647.1 nm and 1 064 nm, vary from 400-1 100 nm, are cho sen for the calibration experiments. The results indicate that the absolute spectral responsivity uncertainty is better than 0.02% in visible light wave band, and 0.03% at 1 064 nm.