摘要
介绍以光电效应为理论基础的反射率测量方法,按一定的技术指标,对显微光度计进行稳定性校定.
The mea surement methods of reflectivity basedon the theory of electrooptical effect was introduced in this paper,and also,the calibration of the stability of MPV 3 micro photometer according to some technical parameters is discussed.
出处
《分析科学学报》
CAS
CSCD
1998年第4期329-331,共3页
Journal of Analytical Science