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Enhanced ultraviolet emission from ZnO thin film covered by TiO_2 nanoparticles

Enhanced ultraviolet emission from ZnO thin film covered by TiO_2 nanoparticles
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摘要 A ZnO thin film covered by TiO2 nanoparticles is prepared by electron beam evaporation. The structure and surface morphology of the sample are analyzed by X-ray diffraction （XRD） and atomic force microscopy （AFM）, respectively. Photoluminescence is used to investigate the fluorescent property of the ample. The results show that the ultraviolet （UV） emission of the ZnO thin film is greatly enhanced after it is covered by TiO2 nanoparticles while the green emission is suppressed. The enhanced UV emission mainly results from the fluorescence resonance energy transfer （FRET） between ZnO thin film and TiO： nanoparticles. This TiO2-ZnO composite thin film can be used to fabricate high-efficiency UV emitters. A ZnO thin film covered by TiO2 nanoparticles is prepared by electron beam evaporation. The structure and surface morphology of the sample are analyzed by X-ray diffraction （XRD） and atomic force microscopy （AFM）, respectively. Photoluminescence is used to investigate the fluorescent property of the ample. The results show that the ultraviolet （UV） emission of the ZnO thin film is greatly enhanced after it is covered by TiO2 nanoparticles while the green emission is suppressed. The enhanced UV emission mainly results from the fluorescence resonance energy transfer （FRET） between ZnO thin film and TiO： nanoparticles. This TiO2-ZnO composite thin film can be used to fabricate high-efficiency UV emitters.
作者 徐林华 沈华 李相银 朱日宏
机构地区 Department of Applied Physics Institute of Electronic Engineering and Photo-Electric Technology
出处 《Chinese Optics Letters》 SCIE EI CAS CSCD 2009年第10期953-955,共3页 中国光学快报（英文版）
关键词 Atomic force microscopy Electron beams Energy transfer FLUORESCENCE Metallic films NANOPARTICLES Optical films Surface structure Thin film devices Thin films X ray diffraction Zinc oxide Atomic force microscopy Electron beams Energy transfer Fluorescence Metallic films Nanoparticles Optical films Surface structure Thin film devices Thin films X ray diffraction Zinc oxide
分类号 O484 [理学—固体物理]
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Chinese Optics Letters
2009年 第10期

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