基于加速性能退化的元器件贮存寿命预测

Component Storage Life Prediction Based on Accelerated Performance Degradation

提出了基于加速性能退化的元器件贮存寿命预测流程,重点对元器件退化轨迹模型的建立和加速退化试验数据处理方法进行了研究。应用非线性的曲线拟合法来建立退化轨迹模型,并评价其拟合优度。加速退化试验数据的处理主要应用伪寿命分布与加速退化模型拟合的方法,从而外推正常应力水平下元器件的贮存寿命。最后,应用所提出的贮存寿命预测方法对某型钽电容的贮存寿命进行了预测,并验证了该方法具有一定的效用性。

The flow of component storage life prediction based on the accelerated performance degradation was presented with focus on the degradation path modeling and the accelerated degradation test data processing. The non-linear curve fitting was applied to establish the degradation path model and evaluate its goodness-of-fit. The accelerated degradation test data was processed through the pseudo-life distribution fitting with the accelerated degradation model to extrapolate the normal stress level during the storage life of the components. Finally, the proposed storage life prediction method was used to predict the storage life of a tantalum capacitor and the validity of this method was verified.