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W-O+W-A的GNS算法

GNS Algorithm for W-O+W-A
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摘要 针对电路板线或和线与(W-O+W-A)共存的互连故障诊断问题,提出了针对W-O+W-A的GNS算法.该算法采用组同时具备W-O和W-A对角独立性移位序列、网络同时具备W-O和W-A对角独立性移位序列和转移网络同时具备W-O和W-A对角独立性移位序列组成W-O+W-A的GNS序列,重点对其故障诊断能力进行了讨论,并进行了算法的性能验证. To study the diagnostic problem of W-O + W-A interconnect fault of PCB (Printed Circuit Board), GNS algorithrns for W-O + W-A is put forward. The algorithm uses group shift sequence with both W-O and W-A diagonal independence, network shift sequence with both W-O and W-A diagonal independence and transferred network shift sequence with both W-O and W-A diagonal independence to form GNS sequence for W-O + W-A. Its fault diagnostic capability is discussed and capability validation is accomplished.
机构地区 装甲兵工程学院
出处 《微电子学与计算机》 CSCD 北大核心 2009年第11期66-69,共4页 Microelectronics & Computer
基金 国家自然科学基金项目(60871029)
关键词 边界扫描 互连诊断 算法 诊断算法 boundary-scan interconnect diagnosis algorithm diagnosis algorithm
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  • 1牛春平,陈圣俭,常天庆,任哲平.一种紧凑性指标最小的抗误判算法[J].微电子学与计算机,2005,22(5):159-161. 被引量:3
  • 2胡政.[D].长沙:国防科技大学机电工程及自动化学院,2000.
  • 3A Hassan, J Rajski and V K Agarwal. Testing and Diagnosis of Interconnects using Boundary Scan Architecture.Infl Test Conf, 1988: 126-137.
  • 4Najmi Jarwala and Chi W Yau. A New Framework for Analyzing Test Generation and Diagnosis Algorithms for Wiring Interconnects. Infl Test Conf, 1989: 63-70.
  • 5P Goel and M T McMahon. Electronic Chip in-place Test.Infl Test Conf, 1982: 83-90.
  • 6L YUngar. Hierarchical Built-In Test: An Alternative Test and Report Strategy. IEEE AUTOTESTCON, 1995:456-463.
  • 7P T Wagner. Interconnect: Testing With Boundary Scan.Intl Test Conf, 1987: 52-57.
  • 8Sousa J T,Cheng Y K.Boundary-scan interconnect diagnosis.London:Kluwer Academic Publishers,2001

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