摘要
对非超高真空条件下在有SiO2图形的硅单晶衬底上用离子束溅射淀积非晶硅薄膜,经过真空退火形成的横向固相外延生长及其影响因素进行了研究,得出了有利于L-SPE生长的材料参数和工艺处理条件。
This paper introduces the deposition of amorphous thin silicon films on the single Si crystal substrates with patterned SiO 2 by ultrahigh vacuum ion beam sputtering and presents the studies on the lateral growth of solid phase epitaxy(L SPE)formed by vacuum annealing and its effective factors.Advantageous material parameters and processing conditions to the L SPE growth were obtained.
出处
《半导体技术》
CAS
CSCD
北大核心
1998年第5期51-53,共3页
Semiconductor Technology