摘要
分析了Kirkpatrick-Baez(KB)显微镜的成像性质与周期多层膜元件间的关系。基于分辨力和集光效率要求,设计了KB显微镜的光学结构,模拟了KB系统的成像质量,用W/B4C周期多层膜反射镜进行了X射线成像实验,在±100μm视场内得到优于5μm的空间分辨力结果。实验与模拟结果的对比表明,加工精度和球差是影响中心视场分辨力的关键因素,有效视场的大小受多层膜角度带宽的限制。
Relation between imaging characteristic of Kirkpatrick-Baez(KB) microscope and periodic multilayer films is ana- lyzed. The optical structure of KB microscope is designed based on resolution and collection efficiency requirements. Imaging qual- ity is simulated, and 8 keV X-ray imaging experiment by KB microscope with W/B1 C periodic multilayer is performed, the resolu- tion is about 2 μm in central field and better than 5 μm in±100 μm field. The result comparison between simulation and experi ment shows spherical aberration and mirror machining precision are the key factors influencing the resolution of central field, and the range of effective field of view is lira{ted by angle bandwidth of periodic multilayer.
出处
《强激光与粒子束》
EI
CAS
CSCD
北大核心
2009年第11期1681-1685,共5页
High Power Laser and Particle Beams
基金
国家高技术发展计划项目