高可靠锁相环设计技术研究

Research on Design Techniques for High Reliable Phase-Locked Loops

单粒子瞬变(SET)现象对高性能计算的影响日益严重,本文对高性能微处理器中锁相环(PLL)的RHBD(Radia-tion-Hardened-By-Design)加固方法进行了分析和总结,从系统级和电路级两个方面对PLL的SET加固方法进行了分类研究。分析结果表明,设计加固方法可以在较高的层次上考虑加固问题,降低了工艺依赖性,可以有效地提高PLL可靠性。

The radiation-hardened-by-design （RHBD） techniques were reviewed for single-event transients （SETs） in phase-locked loops within high performance microprocessors, as SETs induced soft errors increasingly affect the high performance computing applications. The circuit hardened strategies for SETs were discussed respectively in systematic view and circuit level. It was concluded that the hardened design could be developed at higher level to achieve high reliability of the PLL, which is not depending on the process.