摘要
根据实验数据描绘出红外焦平面阵列探测器随温度变化的平均响应曲线。在分析平均响应曲线特性的基础上,介绍了传统的二次曲线拟合算法的基本原理,提出了简化的二次曲线拟合算法。并采用此方法完成了以ARM处理器和FPGA为核心的红外焦平面阵列实时非均匀性校正系统的硬件设计,其结构比较简单,实现过程较容易,校正效果理想。
According to experimental data , the average response curve of infrared （IR） detetors changing with temperature is obtained. On the basis of analyzing the characteristics of the curve, introduced are the basic principles of traditional quadratic curve fitting algorithm. A simplified quadratic curve fitting algorithm is put forward. Applying this method, the hardware with a simple structure and realizing process is designed for the real-time non-uniformity correction system of IRFPA. ARM processor and FPGA are used as its core.
出处
《半导体光电》
CAS
CSCD
北大核心
2009年第5期763-766,共4页
Semiconductor Optoelectronics
关键词
响应曲线
二次曲线
拟合
非均匀性
response curve
quadratic curve
fitting
non-uniformity
