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Voltage-induced material removal mechanism of copper for electrochemical-mechanical polishing applications 被引量:4

Voltage-induced material removal mechanism of copper for electrochemical-mechanical polishing applications
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摘要 The current-voltage (I-V) curves, such as linear sweep voltammetry (LSV) and cyclic voltammetry (CV), were employed to evaluate the effect of electrolyte concentration on the electrochemical reaction trend. From the I-V curve, the electrochemical states of active, passive, transient and trans-passive region could be characterized. And then, the mechanism of the process of voltage-induced material removal in electrochemical mechanical polishing (ECMP) of copper was investigated. Scanning electron microscopy (SEM) and energy dispersive spectroscopy (EDS) analyses were used to observe the surface profile. Finally, the oxidation and reduction processes of the Cu surface were monitored by the repetition of anodic and cathodic potential from cyclic voltammetry (CV) method in acid-and alkali-based electrolyte. The current--voltage (I-V) curves, such as linear sweep voltammetry (LSV) and cyclic voltammetry (CV), were employed to evaluate the effect of electrolyte concentration on the electrochemical reaction trend. From the I-V curve, the electrochemical states of active, passive, transient and trans-passive region could be characterized. And then, the mechanism of the process of voltage-induced material removal in electrochemical mechanical polishing (ECMP) of copper was investigated. Scanning electron microscopy (SEM) and energy dispersive spectroscopy (EDS) analyses were used to observe the surface profile. Finally, the oxidation and reduction processes of the Cu surface were monitored by the repetition of anodic and cathodic potential from cyclic voltammetry (CV) method in acid- and alkali-based electrolyte.
出处 《中国有色金属学会会刊:英文版》 CSCD 2009年第B09期262-265,共4页 Transactions of Nonferrous Metals Society of China
基金 supported by grant No.R01-2006-000-11275-0 (2008) from the Basic Research Program of the Korea Science & Engineering Foundation
关键词 电化学机械抛光 材料去除机理 铜电极 电压 诱导 线性扫描伏安法 扫描电子显微镜 循环伏安法 electrochemical mechanical polishing linear sweep voltammetry cyclic voltammetry HNO3 KNO3 electrolyte
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参考文献13

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同被引文献9

  • 1张荣发,单大勇,韩恩厚,郭世柏.Development of microarc oxidation process to improve corrosion resistance on AZ91HP magnesium alloy[J].中国有色金属学会会刊:英文版,2006,16(B02):685-688. 被引量:10
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  • 9李炎,刘玉岭,牛新环,卜小峰,李洪波,唐继英,樊世燕.Application of a macromolecular chelating agent in chemical mechanical polishing of copper film under the condition of low pressure and low abrasive concentration[J].Journal of Semiconductors,2014,35(1):146-150. 被引量:14

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