纳米材料的几种扫描探针显微表征方法

Several Scanning Probe Microscopy Characterization Techniques on Nanomaterials

扫描探针显微镜(SPM)作为一种广泛应用的表面表征工具,不仅可以表征三维形貌,还能定量地研究表面的粗糙度、孔径大小和分布及颗粒尺寸,在许多学科均可发挥作用.以纳米材料为主要研究对象,综述了国外最新的几种扫描探针显微表征技术,包括扫描隧道显微镜(STM)、原子力显微镜(AFM)和近场扫描光学显微镜(SNOM)等方法,展示了这几种技术在纳米材料的结构和性能方面的应用.

Scanning probe microscopy （SPM） is a powerful tool for surface characterization. It could be used to represent three dimensional morphology and surface roughness, aperture size, distribution, .so it can be applied to many scientific fields. The several recent scanning probe spectroscope characterization techniques are summarized, including scanning tunneling microscope（STM）, atomic force microscope （AFM） and scanning near-field optical microscopy （SNOM）, which could provide useful information concerning the structure and character of nanomaterials.