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基于等确定位切分的LFSR重播种方法 被引量:1

LFSR reseeding method based on dividing test cubes by equal number of specified bits
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摘要 文中提出了一种新颖的基于确定位个数相等切分的LFSR(线性反馈移位寄存器)重新播种方法。针对确定性测试集中不同的测试向量所包含确定位的位数差异较大的特点,将所有测试向量串成一条数据流,按照确定位个数相等的策略对该数据流进行切分,然后对得到的新测试向量集进行LFSR编码,达到提高测试数据压缩率的目的。本方案解压结构仅需单个LFSR和一个简单的控制电路,且由于等长度的种子解压时测试数据传输协议简单。与目前国内外同类方法相比,具有测试数据压缩率高、解压结构简单及硬件开销较小等特点。 A novel scheme of LFSR(linear feedback shift register) reseeding method based on dividing test cubes by equal number of specified bits is presented in this paper. As the number of specified bits of different test patterns varies widely in a deterministic test cube, all test patterns are concatenated to a data flow. The data flow is divided by equal number of specified bits into new test patterns, and then these new test patterns are encoded by LFSR. Thus the proposed scheme reaches the target of increasing the encoding efficiency. The decompression structure of the proposed scheme only contains a LFSR and a simple control circuit. Its transmission protocol of decompression for transmitting test data is also simple because of the seeds with the same length. Compared with the previous schemes, the proposed scheme can increase the encoding efficiency with simple decompression structure and less area overhead.
出处 《电子测量与仪器学报》 CSCD 2009年第10期55-61,共7页 Journal of Electronic Measurement and Instrumentation
基金 国家自然科学基金(编号:60876028)资助项目 国家自然科学基金(编号:60633060)资助项目 教育部博士点基金(编号:200803590006)资助项目 省海外高层次人才基金(编号:2008Z014)资助项目
关键词 线性反馈移位寄存器 确定位 切分 重新播种 LFSR specified bits divide reseeding
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  • 1胡瑜,韩银和,李晓维.SOC可测试性设计与测试技术[J].计算机研究与发展,2005,42(1):153-162. 被引量:42
  • 2李扬,梁华国,刘军,胡志国.基于部分测试向量切分的LFSR重新播种方法[J].计算机辅助设计与图形学学报,2007,19(3):361-365. 被引量:9
  • 3Chandra Anshuman,Chakrabarty Krishnendu.Test data compression and decompression based on internal scan chains and Golomb coding[J].IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems,2002,21(6):715-722
  • 4Chandra Anshuman,Chakrabarty Krishnendu.Test data compression and test resource partitioning for system-on-a-chip using frequency-directed run-length (FDR) codes[J].IEEE Transactions on Computers,2003,52(8):1076-1088
  • 5Würtenberger A,Tautermann C S,Hellebrand S.A hybrid coding strategy for optimized test data compression[C]// Proceedings of IEEE International Test Conference,Charlotte,NC,2003:451-459
  • 6Rajski J,J Tyszer,M Kassab,et al.Embedded deterministic test for low cost manufacturing test[C]// Proceedings of International Test Conference,Baltimore,MD,2002:301-310
  • 7Koenemann B,Barnhart C,Keller B,et al.A SmartBIST variant with guaranteed encoding[C]// Proceedings of VLSI Test Symposium,Marina Del Rey,CA,2001:325-330
  • 8Krishna C V,Touba Nur A.3-Stage variable length continuousflow scan vector decompression scheme[C]// Proceedings of VLSI Test Symposium,Napa Valley,CA,2004.79-86
  • 9Hellebrand S,Tarnick S,Rajski J,et al.Generation of vector patterns through reseeding of multiple-polynomial linear feedback shift registers[C]//Proceedings of International Test Conference,Baltimore,MD,1992:120-129
  • 10Hellebrand S,Rajski J,Tarnick S,et al.Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers[J].IEEE Transactions on Computers,1995,44(2):223-233

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