基于子网络撕裂的模拟电路可测性分析

Testability Analysis of Analog Circuits Based on Sub-networks Tearing Technology

网络撕裂法是故障诊断方法中一个重要课题,本文针对网络撕裂法要求撕裂点必须全部可及的限制,找到了部分撕裂点为不可及点的子网络可解的划分条件。同时对子网络的可测性进行了分析研究,为进一步在子网络内定位故障元件奠定了基础。

Law of network torn is an important subject in failure diagnosis. Focus on the limitation that all torn terminals must be accessible, the subdivision solution of sub-networks those partial torn terminals inaccessible is addressed. Study of sub-networks of testability that buihts the basis of further locating fault modules of the sub-networks is given.