摘要
采用磁控溅射方法制备了NiFe/Cu和NiFe/Mo两个系列的多层膜,进行了结构、磁性和磁电阻测量,并对部分NiFe/Cu多层膜样品作了电镜分析。对于NiFe/Cu多层膜,在室温下测量到巨磁电阻随Cu层厚度振荡的第一、二、三峰。在NiFe/Mo多层膜样品中未发现巨磁电阻效应。讨论了非磁性层对多层膜的磁性、界面结构和巨磁电阻效应的影响。
The NiF/Cu and NiFe/Mo multilayers(MLs) were deposited by dc magnetron sputtering. The magnetoresistance and the magnetism of the MLs were measured, and the cross-sectional images of the NiFe/Cu MLs were analyzed by transmission electron microscopy (TEM). The three peaks of MR ratio for NiFe/Cu MLs were observed at room temperature as the thickness of Cu layer was varied, while no MR of NiFe/Mo MLs was found with the varied thicknesses of Mo. The dependence of GMR on interface structure was studied.
出处
《材料科学与工艺》
EI
CAS
CSCD
1998年第3期24-28,共5页
Materials Science and Technology
基金
北京市自然科学基金
北京市教委科学研究与发展研究计划项目
关键词
多层膜
巨磁电阻
界面结构
镍铁/钼
镍铁/铜
NiFe/Cu multilayers
NiFe/Mo multilayers
giant magnetoresistance
interface structure