约瑟夫森结阵列在射频辐照下的微波感应台阶研究

Microwave-Induced Steps of Josephson Junction Arrays under rf Radiation

约瑟夫森结阵列在射频辐射下的微波感应台阶是利用约瑟夫森结阵列作为射频信号检测和电压标准等应用的基础。采用数值仿真的方法,对约瑟夫森结阵列在不同情况下的微波感应台阶进行了较为系统的研究。研究结果包括射频电流幅度、射频电流频率、约瑟夫森结的McCumber参数、约瑟夫森结参数的不一致性和热噪声等对微波感应台阶的影响,结果对指导实验和解释实验现象具有一定的参考价值。

The microwave-induced step of Josephson junction arrays under rf radiation should be the basis of their applications as rf signal detectors and voltage standards. Microwave-induced steps in different situations are systemically investigated via numerical simulation. The results include the influence of rf current amplitude and frequency, McCumber parameter, parameter spread of Josephson junctions and thermal noise on the microwave-induced steps. The results are of great value for the explanation of experimental results.