电阻阵列非均匀性校正算法实时性研究

Research on Real-time Quality of Resistor Array Non-uniformity Correction

非均匀性是电阻阵列输出图像固定噪声的主要来源,非均匀性校正是电阻阵列应用于半实物仿真中图像实时生成的一个不可缺少的环节。通过对校正算法的分析,设计算法实时性测试系统,并对校正在线算法进行改进,满足200 Hz的帧频要求。在两种硬件平台方案下对算法的实时性进行测试,测试结果说明:非均匀性校正算法是影响动态红外图像生成实时性的一个重要因素,采用专用的硬件计算设备是提高整个系统实时性的必然选择。

The non-uniformity characteristic is the main source of image fixed pattern noise projected by resistor array. The non-uniformity correction （NUC） is a necessary stage in the dynamic infrared image generation involved in HWIL simulation facility. According to the analysis of the NUC algorithm, a test system is designed to investigate the real-time quality of the NUC online algorithm. The algorithm is improved to satisfy the demand for frame rate of 200 Hz. The test is carried out on two hardware platform. The result indicate that the NUC online algorithm is an important factor which greatly impact the real-time quality of the whole dynamic infrared image generation system and a special coprocessor hardware will be undoubtedly selected to improve the real-time quality of the NUC.