摘要
采用Ｘ射线荧光光谱仪测定铝、硅质耐火材料，研究了系统制样方法及基体吸收－增强效应的校正，还研究了测定精度及制样精度，拓展了铝、硅质耐火材料的分析范围。
A method for determination of Al-Si refractories by X-ray fluoresence spectrometry is described in this paper.Aseries of sampling methods and correction of metrix absorb-strength effect are studied.Also,determination precision and sampling precision are studied.Analytical range is wided.
出处
《冶金分析》
CAS
CSCD
北大核心
1998年第5期35-38,共4页
Metallurgical Analysis
