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基于渐近解的静电成像电子光学近轴横向像差理论 被引量:1

On Theory of Paraxial Lateral Aberrations of Electrostatic Imaging Electron Optics Based on the Asymptotic Solutions
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摘要 在迄今为止的成像电子光学研究中,备受关注的是二级近轴横向像差(即二级近轴色差)和三级几何横向像差,几乎忽略了三级近轴色差和三级近轴放大率色差的存在,理论上也没有给出近轴横向像差的一般形式.作者基于近轴方程的渐近解研究近轴横向像差的一般理论,探讨了近轴方程渐近解系数之间的关系式,证明其间是相互关联的.所得结果为研究简明形式的近轴横向像差提供理论基础. In imaging electron optics, study of geometrical lateral aberrations of third order and paraxial lateral aberrations of second order (i. e. paraxial chromatic aberrations of second order) has traditionally been paid more attention to, but the existence of paraxial chromatic aberrations of third order and paraxial chromatic aberrations of magnification of third order was almost ignored, the general form of paraxial lateral aberration has not been studied theoretically. In the present paper, the paraxial lateral aberrations expressed in general form have been derived emphatically by using asymptotic solutions of paraxial equation. The relationship between the coefficients of asymptotic solutions of paraxial equation has been investigated, which proves that the coefficients of asymptotic solutions are related each other. Results of the present paper will have theoretical significance for studying the simple and clear form of paraxial lateral aberrations.
作者 周立伟
出处 《北京理工大学学报》 EI CAS CSCD 北大核心 2009年第11期941-946,共6页 Transactions of Beijing Institute of Technology
基金 国家自然科学基金资助项目(60771070) 高等学校博士点专项科研基金资助课题(B-117)
关键词 电子光学成像系统 静电阴极透镜 像差理论 近轴横向像差 近轴色差 近轴放大率色差 electron optical imaging systems electrostatic cathode lenses aberration theory paraxial lateral aberrations paraxial chromatic aberration paraxial chromatic aberration of magnification
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参考文献9

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同被引文献6

  • 1Elin B P, Katishaov B A, Kylikov Y V, et al. Numerical methods of optimization for emission electron optical systems[M]. Novosibilsk: Science Press, 1987.
  • 2Monastyrski M A. On asymptotic solutions of paraxial equation of electron optics [J]. Journal of Technical Physics, 1978,48(6) :1117-1122. (in Russian).
  • 3Reeknagel A. Theorie des elektrisohen elektronen miktroskops fur selbstrakler[J]. Z Angew Physik, 1941, 119:689-708. (in Germen).
  • 4Artimovich L A. Electrostatic properties of emission systems [ J]. Information of Academy of Sciences. USSR, Series of Physics, 1944, 8(6):313 -328. (in Russian).
  • 5Chou L W. Electron optics of concentric spherical electromagnetic focusing systems[J]. Advances in Electronics and Electron Physics, 1979,52:119 - 132.
  • 6Zhou Liwei. On theory of paraxial lateral aberrations in imaging electrostatic optics based on the asymptotic solutions[J]. International Symposium on Photoelectronie Detection and Imaging: Technology and Applications, Proceedings of SPIE, 2007,6621:662101- 662112.

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