摘要
介绍叠盖电极探测器的物理机理和结构，与标准结构探测器比较，其响应率和黑体探测率均有大的增长。实验结果表明响应率增长约１倍，黑体探测率增长约３０％。无需改变现有工艺，成功制备实用工程探测器，性能明显提高。
The principle and structure of advanced IR detectors with overlap contacts are presented. Comaring with standard design detector the responsivity and detectivity increases considerably. Experimentally, responsivity of the overlap contacts is two times that of the standard design, D 1.3 times. The high performance MCT detectors with overlap contacts manufactured by current technology have been applied in termal imaging systems.
出处
《红外技术》
CSCD
北大核心
1998年第6期12-16,共5页
Infrared Technology
