摘要
本文报道了分子束外延生长的应变层超晶格Zn0.77Cd0.23Se/ZnSe和ZnSe/ZnS0.12Se0.88的光致发光谱.分析了影响激子线型展宽的主要因素.定量表征了4.4K下合金涨落和阱厚涨落对线型展宽的贡献.理论分析表明,在低温(4.4K)下,合金涨落和阱宽涨落对线型展宽起主导作用.对比结果显示,Zn0.77Cd0.23Se/ZnSe超晶格的合金涨落和阱宽涨落对线型展宽的贡献大于ZnSe/ZnS0.12Se0.
Abstract This paper presents photoluminescence sprectra of Zn 0.77 Cd 0.23 Se/ZnSe and ZnSe/ZnS 0.12 Se 0.88 Strained Layer Supperlattices(SLS). The dominant broadening mechanisms of linewidths (FWHM) for free exciton emissions are analysised. The contribution of alloy concentration fluctuation and well thickness fluctuation to linewidth are calculated. The theoretical results show that the predominant mechanisms of broadening at low temperature (4 4K) are alloy concentration and well thickness fluctuation. Furthermore, it has demonstrated that the quality of ZnSe/ZnS x Se 1- x is superior to that of Zn 0.77 Cd 0.23 Se/ZnSe.
基金
国家自然科学基金