数字电路测试向量自动生成系统的比较

Comparing Automatic Test Pattern Generation System

把遗传算法与蚂蚁算法运用于组合电路向量自动生成系统,并比较两者性能的优劣,根据实验结果进一步提出优化组合方案,将此方案应用于同步时序电路的测试向量自动生成系统中。提出一种优化的数字电路的测试向量自动生成系统。这个系统集合了蚂蚁算法和遗传算法的优点,使系统能在更短时间生成更小的测试集,而又能达到原先的故障覆盖率。

Genetic Algorithm and Ant Swarm Algorithm are both applied to combinational circuits. After comparing the performance of the pros and cons, propose an optimized automatic test pattern generation system for digital circuit. This system combines the advantages of Ant Swarm Algorithm and Genetic Algorithm, so that the system can be generated smaller test set in less time while maintaining the original fault coverage.