摘要
要通过生产实践经验及对比试验的方法,寻找一次金属化过程中封接面质量问题的原因,进而探讨MgO在一次金属化过程中的影响。
In this paper, it finds the reason of seal interface quality in the course of first metalizing, mainly through the experience of practice and method of contrast test, and then studies the effect of MgO in the course of ceramic metalizing.
出处
《真空电子技术》
2009年第5期42-43,共2页
Vacuum Electronics
