应用激光侧向散射测量粒径分布的理论研究

Study of Laser Lateral Scattering Used to Measure Particle Size Distribution

提出一种新型的颗粒测量方法，基于Ｍｉｅ散射理论，从另一独特的视角接收大角度的侧向散射光，并建立新的理论模型，可使测量下限扩展，技术要求有所改善。结合目前已经成熟的半导体激光和ＣＣＤ技术，运用此原理可使颗粒测量仪器向更轻便。

This paper puts forward a method based on Mie scattering theory, which detects the lateral scattering light from a new view point. A novel theoretical calculation model is established. According to this principle the measuring range of particle sizes is extended while technical requirements are reduced. Combining with mature semiconductor lasers and the CCD image technique, this method will make the particle sizer portable and more sensitive.