摘要
实验上利用四孔的掩膜和柱透镜成功的在LN晶体中构造了不同类型的缺陷态光折变光子晶格,发现当缺陷的写入角度与c轴垂直时,写入的缺陷最好,平行时最差,并描绘了折射率随时间变化曲线,发现写入时间为40分钟时为最佳写入时间。推导了四孔掩膜的电磁场分布并在理论上模拟了四孔掩膜和柱透镜的空间光场分布,验证了此方法的可行性,这对缺陷态光子晶格的研究和应用有一定的意义。
Using four-hole film and Cylindrical Lenses linear defective photorefractive photonic lattice in self-defocusing crystal LN successfully induced by single-slice-beam method, we found when the angle of defect plumb to the c axis, the defective was better than others and when the angle of defect parallel to the c axis, the phenomenon was bad , correlation curve of refractive index with time was plotted, and found that write time of 40 minutes was the best time. The space electromagnetic field about of fourhole film was deduced, moreover the space light distributing of film and Cylindrical Lenses, were simulated theoretically which testify that this method was feasible, and meaningful to the defective photorefracrive photonic lattice in study and application in the future.
出处
《信息记录材料》
2009年第6期13-15,共3页
Information Recording Materials
基金
国家自然科学基金(60467002)
内蒙古自然科学基金(200408020111)
内蒙古师范大学研究生科研创新基金(CXJJS08011)资助项目
关键词
片光法
LN晶体
光子晶格
缺陷
single-slice-beam method
lithium niobate crystal
photonic lattice
defect