低拉伸应力下PBX的老化实验研究

Experimental Study on Aging of PBX under Low Tensile Stress

为了研究PBX在超长时低应力拉伸下的老化问题,设计了一种能进行超长时恒定拉伸应力加载的新实验装置,并验证了装置的可靠性。对以HMX和TATB为基的PBX炸药进行不同拉伸应力下的常温长时加载和45℃下的高温长时加载试验,研究了应力水平和温度环境对样品抗长时拉伸能力的影响,比较了相同条件下模压样品和等静压样品抗长时低应力拉伸的能力。结果表明,本实验能够有效研究PBX在低应力拉伸下的承载能力,并获得了在一定温度一定拉伸应力条件下PBX的老化寿命。

In order to study aging of PBX under low tensile stress, a new device was designed which can conveniently be used to carry out longterm constant tensile loading. The reliability of device was proved by experiments. The longterm tensile loading experiments under different stress states of PBX based on HMX and TATB were done at normal temperature and 45℃.The effect of different stress level and different temperature environment on PBX was studied. The low stress tensile capacity of mould and isostatic pressing PBX were compared. The results show that this experiment can validly be used to study the tensile capacity of PBX,and aging life of PBX under some temperature and some stress states are obtained.