对某微波器件热真空试验自激故障的分析及解决方案

Analysis of Thermal Vacuum Test Self-Excitation Failure of Microwave Devices and Their Solutions

某微波放大器在做热真空试验时产生自激现象,详细分析了产生故障的原因,指出真空高温引起的盒体形变,是导致电路不能正常工作的主要原因,提出了解决措施,并对解决措施进行了应力分析及工艺可行性分析。其观点对进行航空、航天电子设备的结构设计人员有一定的参考价值。

Self-excitation phenomenon occurred in certain microwave amplifier thermal vacuum tests. This paper analyses the causes of failure in detail, pointing out that box shape change by vacuum high temperature is the main cause leading to the circuit not working properly. A solution is proposed and a stress analysis and technical feasibility analysis are conducted. The concepts of this paper may have certain reference value for structural design of electronic equipment of avionics or used in space.