Ga_(36.5)Sb_(63.5)熔体的电阻率—温度特性

Temperature Dependence of Resistivity of Ga_(36.5)Sb_(63.5) Melt

为分析Ga36．5Sb63．5熔体电阻率的变化规律与液态结构变化的相关性，采用电阻率测试仪（RM）、X射线衍射仪（XRD）测量其电阻率及合金熔体的凝固组织。结果表明，Ga36．5Sb63．5熔体的电阻率-温度曲线在（716～730）℃温度之间出现突变，在突变区域前后温度下所得到的快速凝固组织中均含有GaSb二元相。

In order to analyze the relevance of the resistivity and the liquid structure of Ga36.5 Sb63.5 alloy, the resistivity of Ga36.s Sb63.5 alloy was studied by resistivity meter （RM） and the solidified structure by X-Ray diffraetometer （XRD）. Experimental results show that there is an anomalous point at （7 16 -730） ℃ on the resistivity-temperature curve of Ga36.5 Sb63.5 melt, and that there exists GaSb binary phase in the rapidly-solidified structure at different temperatures the anomalous point.