期刊文献+

A quasi-3-dimensional simulation method for a high-voltage level-shifting circuit structure

A quasi-3-dimensional simulation method for a high-voltage level-shifting circuit structure
原文传递
导出
摘要 A new quasi-three-dimensional (quasi-3D) numeric simulation method for a high-voltage level-shifting circuit structure is proposed. The performances of the 3D structure are analyzed by combining some 2D device structures; the 2D devices are in two planes perpendicular to each other and to the surface of the semiconductor. In comparison with Davinci, the full 3D device simulation tool, the quasi-3D simulation method can give results for the potential and current distribution of the 3D high-voltage level-shifting circuit structure with appropriate accuracy and the total CPU time for simulation is significantly reduced. The quasi-3D simulation technique can be used in many cases with advantages such as saving computing time, making no demands on the high-end computer terminals, and being easy to operate. A new quasi-three-dimensional (quasi-3D) numeric simulation method for a high-voltage level-shifting circuit structure is proposed. The performances of the 3D structure are analyzed by combining some 2D device structures; the 2D devices are in two planes perpendicular to each other and to the surface of the semiconductor. In comparison with Davinci, the full 3D device simulation tool, the quasi-3D simulation method can give results for the potential and current distribution of the 3D high-voltage level-shifting circuit structure with appropriate accuracy and the total CPU time for simulation is significantly reduced. The quasi-3D simulation technique can be used in many cases with advantages such as saving computing time, making no demands on the high-end computer terminals, and being easy to operate.
出处 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2009年第12期58-63,共6页 半导体学报(英文版)
基金 supported by the National Natural Science Foundation of China(No.50777005) the Young Foundation of University of Electronic Science and Technology of China(No.JX0832)
关键词 quasi-3D 3D device simulation high-voltage level-shifting quasi-3D 3D device simulation high-voltage level-shifting
  • 相关文献

参考文献16

  • 1Terashima T, Yoshizawa M, Fukunaga M. Structure of 600 V IC and a new voltage sensing device. Proc ISPSD, 1993:224.
  • 2Murray A F J, Lane W A. Optimization of interconnection- induced breakdown voltage in junction isolated IC's using biased polysilicon field plates. IEEE Trans Electron Devices, 1997, 44:185.
  • 3Chen Xingbi. A semiconductor device. Chinese Patent, Applicant Number 200910000724.5, 2009.
  • 4Falck E, Gerlach W, Korec J. Influence of interconnections onto the breakdown voltage of planar high-voltage pn junctions. IEEE Trans Electron Devices, 1993, 40:439.
  • 5Endo K, Baba Y, Udo Y, et al. A 500 V 1 A 1-chip inverter IV with a new electric field reduction structure. Proc ISPSD, 1994: 379.
  • 6Terashima T, Yamashita J, Yamada T. Over 1000 V n-ch LD- MOSFET and p-ch LIGBT with JI RESURF structure and multiple floating field plate. Proc ISPSD, 1995:455.
  • 7Fujihira T, Yano Y, Obinata S. Self-shielding new high voltage inter-connection technique for HVICs. Proc ISPSD, 1996:231.
  • 8Shimizu K, Rittaku S, Moritani J. A 600 V HVIC process with a built-in EPROM which enables new concept gate driving. Proc ISPSD, 2004:379.
  • 9Terashima T, Shimizu K, Hine S. A new level-shifting technique by divided RESURF structure. Proc ISPSD, 1997:57.
  • 10Davinci User's Manual. Avant! Corporation, TCAD Business Unit. Version 4.1, 1998.

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部