碳纳米管网络导电特征的导电型原子力显微镜研究

Using conductive atomic force microscope on carbon nanotube networks

利用导电型原子力显微镜对大范围碳纳米管(CNT)网络的导电性能进行成像观察.研究发现:在几十微米的成像范围内,每根CNT本身的电阻远小于CNT之间的接触电阻,以致于在电压偏置的网络中不同的CNT呈现电位不同的等位体;CNT的导电性能虽不因与其他CNT的交叠接触而改变,但是如果缠绕成束,则半导体性CNT趋于呈现金属性CNT的导电特征.

Conductive atom force microscopy observations have been performed on carbon nanotube networks. The results indicate that within an imaging range of several tens of micrometers the resistance of a carbon nanotube is much smaller than the contact resistance between two crossed carbon nanotubes and so the potential difference hardly appears along a carbon nanotube if the carbon nanotube network is electrically biased. Besides,if several semiconducting carbon nanotubes wind into a bundle,they tend to appear like metallic carbon nanotubes.