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带无序保护单元的系统可靠性分析 被引量：4

System Reliability Analysis for Protecting Unit of Non-ordered
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摘要 在寿命分布为离散型和连续型的情形下,对带无序保护单元的系统进行可靠性分析,给出了此类系统部分可靠性参数的计算方法和计算结果。同时还给出了一个计算实例,用以说明上述分析结果的具体应用。 Under the situation that the life distribute is discrete and continuous, the system reliability analysis for protecting unit of non-ordered is put forward. Calculation methods and calculation results about part of reliability parameters of the system are given. At last, an example is given, to illustrate the application of above methods.
作者 李立亚 何剑 陆琪
机构地区 湖北第二师范学院数学系 华中师范大学数学与统计学院 华南农业大学理学院
出处 《模糊系统与数学》 CSCD 北大核心 2009年第6期171-174,共4页 Fuzzy Systems and Mathematics
基金 湖北县域经济发展研究中心项目(SK2007C011)
关键词 无序 保护单元 可靠性 冲击 Non-ordered Protecting Unit Reliability Attack
分类号 O213 [理学—概率论与数理统计]
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参考文献3

  • 1Patrick D T. Oconnor, practical reliability engineering (fourth edition)[M]. John Wiley & Sons,Inc. ,2002.
  • 2Kleyner A. Bayesian techniques to reduce the sample size in automotive electronics attribute testing[J]. Microelectron Reliab, 1997,37 (6):879 - 883.
  • 3Zalewski J, et al. Safety of computer control systems: challenges and results in software development[J]. Annual Reviews in Control, 2003,27 : 23- 37.

同被引文献17

  • 1陈邵宪.可靠性概论[M].广州:华飞科技出版社,1985.
  • 2PatrickD,Oconnor T.PracticalReliability Engineering (Fourth Edition)[M].John Wiley & Sons,Inc.2002.
  • 3Kleyner A Bayesian Techniques to Reduce the Sample Size in Automotive Electronics Attribute Testing[J].Microelectron Reliab,1997,37(6):879-883.
  • 4Zalewski J,Ehrenberger W,Saglietti F,et al.Safety of Computer Control Systems:Challenges and Results in Software Development[J].Annual Reviews in Control,2003,27:23-37.
  • 5Patrick D T Oconnor. Practical reliability engineering[M]. 4 th Edition. New York: John Wiley & Snos, Inc, 2002.
  • 6Kleuner A. Bayesian techniques to reduce the sample size in automotive electronics attribute testing[J]. Microelectron Reliab, 1997,37(6) :879-883.
  • 7Zalewski J, Ehrenberger W, Saglietti F,et al. Safety of computer control systems: challenges and results in software development[J]. Annual Reviews in Control, 2003,27 :23-37.
  • 8Cha J H, Mi J, Yun W Y. Modelling a general standby system and evaluation of its performance[J]. Applied Stochastic models in Business and Industry, 2008,24: 159-169.
  • 9O'CONNOR P D T. Practical Reliability Engineering [ M]. Washington:Hemisphere Pub. Co. ,1988.
  • 10KLEYNER A. Bayesian techniques to reduce the sample size in automotive electronics attribute testing [ J ] . Microelectron Re- liab, 1997,37(6) :879-883.

引证文献4

模糊系统与数学
2009年 第6期

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