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星载数据管理系统的共模故障分析方法 被引量:2

Common mode failure analysis for on-board data manger system
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摘要 数据管理系统是低能X射线望远镜进行数据传输和数据处理的关键电路模块,为提高可靠性采用冷贮备冗余设计,但冗余设计会引入由共模故障引起的失效。因此,结合空间应用的环境,在对低能X射线望远镜的数据管理系统的故障树分析的基础上,对其进行共模故障方法的研究。首先,针对数据管理系统进行传统故障树的构建;其次,确定数据管理系统的共模故障分析对象,分析共模故障产生的原因及机理;再次,对数据管理系统进行共模故障定量分析;最后,通过对比考虑共模故障和未考虑共模故障的定量结果,提出改进设计措施。通过对数据管理系统进行共模故障定性和定量分析,找出引起发生共模故障的主要原因,并提出改进措施,提高了星载数据管理系统的可靠性。 As a key circuit module of Low Energy X-ray Telescope (LE) for data transmission and data processing, the data manger system adopts cold redundant design of redundancy to improve the reliability. However, the redundant design brings common-mode fault analysis in the system. Therefore, combining with space environment, the paper studies the common-mode failure based on the fault tree analysis method, taking LE as its object. First, the paper builds s Fault Tree on the data manger system. Second, it confirms the object of the common-mode fault analysis, and finds out the reason and mechanism. Third, it makes qualitative analysis and quantitative analysis on the system. At last, by comparing the quantitative analysis results when considering and unconsidering the common-mode failures, the measures to improve the design are put forward. Through common-mode failure analysis on the data manger system, it gets the main causes that lead to the common-mode failure, and puts forward the measures to improve the reliability.
出处 《中国惯性技术学报》 EI CSCD 北大核心 2009年第6期742-748,共7页 Journal of Chinese Inertial Technology
基金 "973"国家重点基础研究发展规划(G2000077604)资助
关键词 空间应用 共模故障 故障树 可靠性 space application common mode failure fault tree analysis reliability
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参考文献11

  • 1Kaufman L M, Bhide S, Johnson B W. Modeling of common-mode failures in digital embedded systems[C]// 2000 Proceedings of the 2000 Annual Reliability and Maintainability Symposium, 2000: 350-357.
  • 2Vaurio J K. Common cause failure models, data, quantification[J]. IEEE Transactions Reliability, 1999, 48(3): 213-214.
  • 3Hauptmanns U. The multi-class binomial failure rate model[J]. Reliability Engineering and System Safety, 1996, 53: 85-96.
  • 4GJB/Z299C.电子设备可靠性预计手册[S].北京:总装备部军标出版发行部,2006.
  • 5GJB/Z108A.电子设备非工作状态可靠性预计手册[s].北京:总装备部军标出版发行部,2006.
  • 6张庆祥,王立.行星际空间环境对探测器可靠性影响分析[J].航天器工程,2007,16(6):61-66. 被引量:6
  • 7Garrett H B, Hoffman A R. Comparison of spacecraft charging environments at the Earth, Jupiter, and Saturn[J]. IEEE Transactions on Plasma Science, 2000, 28(6): 2048-2057.
  • 8Brand V P. UPM 3.1: A pragmatic approach to dependent failures assessment for standard systems[R]. SRD Association Report SRDA-R13. UK. AEA Technology PLC, 1996.
  • 9仇永萍.UPM共因失效分析方法在概率安全评价中的适用性[J].核科学与工程,2008,28(4):376-380. 被引量:8
  • 10Jussi K V. The probabilistic modeling of external common cause failure shocks in redundant system[J]. Reliability engineering and system safety, 1995, 50: 97-107.

二级参考文献15

  • 1仇永萍,宋明海.UPM共因失效分析方法在系统可靠性分析中的应用[J].核标准计量与质量,2004,0(z1):32-39. 被引量:4
  • 2IAEA. Procedures for Conducting Probabilistic Safety Assessment of Nuclear Power Plant (level 1)[S]. Safety Series No. 50-P-4,July, 1992.
  • 3IAEA. Regulatory Review of Probabilistic Safety Assessment Level 1 [R]. IAEA-TECDOC-1135, Feb, 2000.
  • 4V P Brand. UPM 3. 1: A Pragmatic Approach to Dependent Failures Assessment for Standard Systems[R]. SRD Association Report SRDA-R13, UK, AEA Technology PLC, 1996.
  • 5Marshall F M ,et al. Common-Cause Failure Parameter Estimations[R]. NUREG/CR-5497,1998.
  • 6Barnes C,Johnston A.Radiation hardness assurance is-sues associated with COTS in JPL flight systems:the challenge of Europa. http://klabs.org/DEI/References/Radiation.ht m .
  • 7Pritchard B E,Swift G M,Johnston A H.Radiation effects predicted,observed,and compared for space-craft systems[].Radiation Effects Data Workshop.2002
  • 8Kayali S.Microelectronics reliability considerations for extreme environments[].Conference on Electronics for Extreme Environments.1999
  • 9Sharma A K.NASA extreme environment parts andpackaging applications and reliability issues[].ht-tp://neppnasagov/eeelinks/August/augin-troht m.
  • 10Claeys C,Simoen E,Mohammadzadeh A.Guidelines for cryogenic spaceborn CMOS testing and optimization[].th European Workshop on Low Temperature E-lectronics.2002

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