功率型LED封装中的热阻分析

Analysis and Measurement of Thermal Resistance Induced by LED Bonding

芯片固晶过程是影响功率型LED封装热阻的重要方面。分析了银胶、共晶合金等不同导热率的固晶材料产生的固晶热阻的大小,并基于正向电压测结温法首次提出了一种测量LED固晶热阻的方法,得到了很好的测量结果,能有效分析封装结构中各部分引入的热阻的大小。

The LED chip bonding is an essential technology to reduce the thermal resistance of LED. Thermal performance of bonding materials such as Ag-epoxy resin was analyzed using heat transfer tools. For the sake of assessing the bonding technology, a method of measuring the thermal resistance induced by bonding process was proposed for the first time based on the forward working voltage method. It is shown that the theoretical simulation results agreed well with the measured results.