摘要
通过对有关标准要求的分析,提出统计过程控制(SPC)体系文件的组成、构架,形成与质量管理体系文件相对应的SPC体系文件模型,并对文件编制过程中的相关薄弱环节与标准的符合性进行了探讨,给出了推荐做法。以期对各实施SPC的电子元器件单位有一定的实用性指导。
Based on the relative standards, the composition and frame of statistical process control (SPC) system document are analyzed, and the model of SPC system document corresponding with quality management system document is put forward. The bottleneck problems during the formation process of the related documents, as well as the conformability of the SPC documents with relative standards are discussed. Some methods which can be used by companies engaged in electronic components are recommended.
出处
《半导体光电》
CAS
CSCD
北大核心
2009年第6期853-856,共4页
Semiconductor Optoelectronics