确定相薄片偏振参量的椭偏仪法研究

Study on Ellipsometry in Confirming Polarization Parameters of Phase Slice

对彼比科夫(БΗδΗΚΟΒ)提出的测量相薄片的相移和透射光相对振辐系数的椭偏仪法作了改进,论述了该改进方法依据的理论,采用的步骤;并用此方法测量了云母片的相移和透射光相对振辐系数等偏振参量.结果表明:该方法不需要复杂的专门设备,方法简单,精确度高,为非破坏性测量.

Based on BHδHKOB＇s ellipsometry, a distinct method is introduced to improve the ellipsometry to measure phase displacement and diascoptic lighting＇s relative amplitude coefficient of phase slice. In this article, it shows the theory and process of the method. The improved method is adopted to measure such polarization parameters as the phase displacement and diascoptic lighting＇s relative amplitude coefficient of mica sheet. The result indicates that the improved method is a non-destructive measurement without any specific instruments. It is easily executed and precisely accurate.