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Chair's Introduction to 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis

Chair's Introduction to 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis
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摘要 Based on the recommendation of ICTD'09 TPC members, this Special Issue of the Journal of Electronic Science & Technology of China (JESTC) contained 22 high quality papers selected from the Proceedings of 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis (ICTD '09) which is fully sponsored by the IEEE Circuits and Systems Society (CASS), and is technically co-sponsored by the University of Electronic Science and Technology of China (UESTC), the Chinese Institute of Electronics (CIE), the China Instrument & Control Society (CIS), and organized by UESTC. Based on the recommendation of ICTD'09 TPC members, this Special Issue of the Journal of Electronic Science & Technology of China (JESTC) contained 22 high quality papers selected from the Proceedings of 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis (ICTD '09) which is fully sponsored by the IEEE Circuits and Systems Society (CASS), and is technically co-sponsored by the University of Electronic Science and Technology of China (UESTC), the Chinese Institute of Electronics (CIE), the China Instrument & Control Society (CIS), and organized by UESTC.
作者 Rueywen Liu
出处 《Journal of Electronic Science and Technology of China》 2009年第4期289-289,共1页 中国电子科技(英文版)
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