摘要
根据Ｍｉｅ光散射理论，本文详细讨论了用可见光波段的光透消光法（Ｌｉｇｈｔｅｘｔｉｎｃｔｉｏｎ）测量微粒尺寸的测粒下限。分析及计算表明，采用合适的最优化计算方法，光透消光法可用于测量亚微米级及以下的超细颗粒。文中给出了数值模拟计算结果及实测结果。
In this paper,A study of measurement lower limit of particle sizer using multi wavelength light extinction is proposed.Analysis and computer numerical simulation demonstrate that submicrometer and nanometer particle can be measured by light extinction particle sizer using multi wavelength.Experiment results are also gived in the paper.
出处
《仪器仪表学报》
EI
CAS
CSCD
北大核心
1998年第5期503-507,共5页
Chinese Journal of Scientific Instrument
基金
上海市自然科学基金
