摘要
以四氯化锡、三氯化铟和氨水为原料,采用化学共沉淀法制备了In掺杂SnO2粉体。实验采用XRD和Zeta电位分析仪对In掺杂SnO2粉体的物化性能进行了研究。结果表明:当In掺杂浓度为2 mol%时,掺杂SnO2粉体具有较低的Zeta电位。相对于纯SnO2粉体,In掺杂改变了SnO2的晶胞参数并增大了其晶胞体积。
In-doped tin oxide powders were prepared by a chemical coprecipitation process using tin tetrachloride, indium trichloride and ammonia as raw materials. The properties of SnO2-based powders doped with In were studied systematically by X-ray diffraction (XRD) and Zeta potential analyzer. The results showed Zeta potential of In-doped SnO2 powders is the lowest when the fraction of In-doped is 2 mol%. Compared with the pure SnO2, the presence of the dopant alters slightly the crystal cell parameter of SnO2 and increases significantly its crystal cell volume.
出处
《人工晶体学报》
EI
CAS
CSCD
北大核心
2009年第6期1485-1488,共4页
Journal of Synthetic Crystals
基金
The project supported by Program of Natural Science Foundation of Jiangxi Province(No.2007GZC0799)
Program of Educational Committee of Jiangxi Province(No.[2005]322
[2006]309)