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基于LFSR种子重播的组合电路测试方法研究

Research of combinational circuit test method based on LFSR reseeding
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摘要 针对组合电路测试数据量大的缺点,提出了一种基于LFSR种子重播的组合电路测试方法,该方法利用内建自测试技术自动生成测试矢量,并利用一个LFSR(Linear Feedback Shift Register)的种子对多个确定性测试向量进行编码压缩,能够显著提高测试数据的压缩率和保证测试的故障覆盖率。仿真试验表明,该方法具有测试序列长度短和故障检测率高的优点,可用于大规模数字电路的自动测试矢量生成。 The test data compression research is a hot issue in the field of digital circuit test. This paper presents a Built- in Self Test vector generation method. Using a LFSR seed,the method makes a number of deterministic test vectors be coded and compressed, and significantly improves compression ratio of the test data. Simulation tests show that the method has advantages of a short length of test sequences and a high rate of fault detection.
出处 《电子测量技术》 2009年第12期1-3,13,共4页 Electronic Measurement Technology
基金 国家自然科学基金(60877065) 哈尔滨市科技创新人才研究专项资金RC2008XK009004
关键词 内建自测试 重播种 LFSR BIST Reseeding LFSR
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