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AMU故障检测中测试响应压缩方法研究 被引量:1

Research on Test Response Compression Methods in AMU Fault Detection
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摘要 测试响应压缩是对AMU故障检测过程中产生的大量数据进行处理的有效方法,如何选择一种有效的压缩方法是AMU测试中一个非常关键的问题;针对常用的两种压缩方法:奇偶压缩和特征分析进行了分析比较;通过建立故障检测模型,找出故障特征矩阵,进而确定测试矩阵;在得出响应矩阵之后,采用两种方法分别进行压缩处理;从硬件开销、故障覆盖率、混淆率和压缩率四个方面出发,对两种方法的性能指标进行理论分析与计算;结果表明,不彻底的奇偶压缩适用于要求测试混淆率比较低的情况,特征分析适用于要求硬件开销较少、检测率较高、压缩效率较高的情况。 Test response compression is the most effective way to deal with the large amount of data produced by the AMU failure testing. How to choose an effect compression method is a key issue in AMU failure testing. The two most commonly used compression methods, the parity compression and the signature analysis, are analyzed and compared in this paper. By establishing the fault detection model, find the fault character matrix, identify the test matrix and obtain the response matrix, the two methods are compared to compress the data separately. With the four measures of hardware overhead, fault detection rate, allasing error probability and compression rate to analyze and calculate performance index of the two methods. The result shows that the halfway parity compression applies to the situation of the low aliasing error probability and in the situation of the low hardware overhead, the high fault detection rate and the high compression rate, the signature analysis can be used.
出处 《计算机测量与控制》 CSCD 北大核心 2009年第12期2368-2370,2373,共4页 Computer Measurement &Control
基金 天津市科技支撑计划重点项目(07ZCKFGX01500) 民航总局科技基金项目(MHRD0705)
关键词 AMU 故障检测 测试响应 奇偶压缩 特征分析 AMU fault detection test response parity compression signature analysis
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  • 1许化龙,袁晓峰,陈淑红.正弦信号波形参数拟合求解的混合优化算法[J].电子测量与仪器学报,2004,18(4):1-5. 被引量:13
  • 2苏德伦,王仕成,王照峰,张安京.基于PXI总线的正弦信号失真度测量[J].计测技术,2006,26(1):39-41. 被引量:2
  • 3HAN Yinhe,LI Huawei,LI Xiaowei,ANSHUMAN Chandra.Response compaction for system-on-a-chip based on advanced convolutional codes[J].Science in China(Series F),2006,49(2):262-272. 被引量:1
  • 4Mitra S, Kim K S. X-compact: An efficient response compaction technique for test cost reduction. In Proc. International Test Conference, Baltimore, USA, 2002,pp.311-320.
  • 5Chandra A, Chakrabarty K. Test resource partitioning for SoCs. IEEE Design & Test of Computers, 2001, 18(9): 80-91.
  • 6Reda S, Orailoglu A. Reducing test application time through test data mutation encoding. In Proc. Design of Automation and Test in Europe (DATE), Paris, France. 2002. nn.387-393.
  • 7Volkerink E H, Khoche A, Mitra S. Packet-based input test data compression techniques. In Proc. Int. Test Conference,Baltimore, USA, 2002, pp.154-163.
  • 8Nourani M, Chin J. Testing high-speed SoCs using low-speed ATEs. In Proc. VLSI Test Symposium, Monterey, USA, 2002,pp. 133-138.
  • 9Saluja K K, Karpovsky M. Testing computer hardware through data compression in space and time. In Proc.Int.Test Conference, Philadelphia, USA, 1983, pp.83-88.
  • 10Bhattacharya B B, Dmitriev A, Goessel M, Chakrabarty K.Synthesis of single-output space compactor for scan-based sequential circuits. IEEE Trans. CAD & CS, 2002, 21(10):1171-1179.

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