摘要
用X射线光电子能谱法(XPS)研究了麦秆节间不同部位皮层的硅化物组成及含量,探索皮层硅化物的碱稳定性。结果表明,在实验条件下,节间所有部位皮层中的硅化物均是由有机硅化物和无机硅化物组成;无机硅化物的含量约为有机硅化物的3倍,且种类更复杂;节间上部皮层的硅化物含量最高,下部皮层的硅化物含量最低;自外至里,上部皮层中硅化物的含量、分布具有与其他禾本科原料皮层相似的规律性,下部皮层的规律性较差。不同硅化物的碱稳定性有差别;部分无机硅化物微块由于其连接机构的碱溶解而脱落,完好地存在于黑液之中。在皮层生物结构中,硅化物的堆砌、连接方式及其碱溶机理有待进一步研究。
The silicides in the cuticle of wheat straw stem were studied by means of XPS-peak-differenating analysis.The results showed that silicides in every part of the wheat straw stem are composed of two sorts of silicides,i.e.organic silicides and inorganic silicides.The main components of the organic silicides are P-MethylSil（linear）,P-PhenylSil（resin）,Ph3SiOSiPh3,Me3SiOSiMe3,Ph3SiSiPh3,Et3SiCl,Et2SiCl2 etc.The inorganic organic silicides are very complex,and the major sorts are Wollastonii,Mica,albite,Kaolinite,sillimanite,materials of Mol.Sieve A and X,SiO2（Vycor）,SiO2（alpha cristobal）,SiO2（guartz）,H Zeoton etc.The components of silicides in different part＇s cuticle are different.
出处
《中国造纸学报》
CAS
CSCD
北大核心
2009年第4期1-4,共4页
Transactions of China Pulp and Paper
基金
国家自然科学基金(20277012)资助项目
关键词
麦秆皮层
硅化物
XPS
分峰拟合
有机硅化物
无机硅化物
cuticle of wheat straw stem
silicides
XPS
peak-differenating-imitatios
organic silicides
inorganic silicides
