内建自测试的测试生成方法研究

Research of test generation for built-in self-test

内建自测试(BIST)方法是目前可测试性设计(DFT)中应用前景最好的一种方法,其中测试生成是关系BIST性能好坏的一个重要方面。测试生成的目的在于生成尽可能少的测试向量并用以获得足够高的故障覆盖率,同时使得用于测试的硬件电路面积开销尽可能低、测试时间尽可能短。内建自测试的测试生成方法有多种,文中即对这些方法进行了简单介绍和对比研究,分析了各自的优缺点,并在此基础上探讨了BIST面临的主要问题及发展方向。

BIST is a best prospect method for DFT and test generation is one of the most important parts of BIST.The focus of test Generation is how to generate test vectors as few as possible that can achieve fault coverage sufficiently while test circuits area overhead and the testing time should be as little as possible.Many methods for test generation are analyzed and contrasted.Finally,we discuss issues remain to be resolved and it development.