混合信号集成电路边界扫描测试技术的实现

Implementation of mixed-signal integrated circuits boundary-scan test

IEEE1149.4为混合信号的测试提供了一项标准,同时也提供了一种重要的可测试性设计(DFT)技术,该技术不仅可以测试芯片或PCB之间的管脚连接是否存在故障,还可以测试芯片的逻辑功能。本文以IEEE1149.4标准为基础,结合混合信号边界扫描测试系统进行了测试验证,完成对混合信号电路的参数测试。

IEEE1149.4 for mixed-signal test provides a standard,but also provides an important design for testability（DFT） technology,which can not only test chip or PCB pins link between the existence of the fault,can test chip logic function.The article IEEE1149.4 standards-based,with some mix-singnal scal test equipments,complete mixed-signal circuit parameters tested.