突触界面结构参数的定量分析法

QUANTITATIVE ANALYSIS METHOD FOR THE STRUCTURAL PARAMETERS OF SYNAPTIC INTERFACE

本实验用IBM-PC微机图像分析系统对小鼠海马与大脑皮层的Gray I型突触电镜图像进行了定量分析,测定了突触后膜致密物质厚度、突触间隙宽度、突触界面曲率和突触活性带长度等结构参数。以DGAVP引起突触结构变化为实例检验了这种定量分析法的可行性与可靠性。本文详细介绍了测量方法和步骤。实验将系统校正、图像测定及数据处理等过程融为一体,既快速又精确,与传统手工测量方法相比,证明了此法的优越性与实用性。

In this experiment the electron micrographs of Gray type synapses in the hippocampus and cerebral cortex of mice were quantitatively analysed by means of an IBM-PC computer image processing system. Measured parameters included the thickness of postsynaptic density, the width of synaptic cleft, the curvature of synaptic interface, and the length of active zone. The feasibility and reliability of this quantitative method, as exemplifie by the synaptic structural changes arising from DGAVP, were examined. The present paper describes the procedure and process for the measurement in detail. The com-puter-system displayed the integration of system-correction, parameter-measurement, and data-processing to produce a melding of rapidity and accuracy. It is evident that this method is useful and has its advantages, as compared with traditional manual measurement.