摘要
提出考虑测试功耗的扫描链划分新方法.首先为基于扫描设计电路的峰值测试功耗和平均功耗建模,得出测试功耗主要由内部节点的翻转引起的结论,因此考虑多条扫描链情况,从输入测试集中寻找相容测试单元,利用扫描单元的兼容性,并考虑布局信息,将其分配到不同的扫描链中共享测试输入向量,多扫描链的划分应用图论方法.在ISCAS89平台上的实验结果表明,有效降低了峰值测试功耗和平均测试功耗.
A novel scan chain partition approach considering test power is presented. The peak test power and average test power of scan - based design circuits is modeled firstly, then the conclusion of test power are produced by the switching activity is obtained, considering the situation of multi - chain, to search the compatible cell from the input test set and make use of the compatibility of the scan cells, considering the layout information, distribute the scan cells to different scan chains, the multi - chain partition approach is based on Graph theory. The experiments on ISCAS89 benchmark show our approach＇s efficiency. The average test power and peak test power are reduced dramatically.
出处
《微电子学与计算机》
CSCD
北大核心
2010年第1期144-146,150,共4页
Microelectronics & Computer
基金
国家自然科学基金项目(60273081
69973014)
哈尔滨工程大学基础研究基金(04088)
