摘要
开展了在伪装网基布上镀In2O3/SnO2薄膜的性能研究,系统分析了薄膜厚度对其光谱反射性能的影响;总结了薄膜厚度对In2O3/SnO2薄膜表面形貌、光谱反射辐射性能的影响规律,为In2O3/SnO2薄膜的红外伪装应用奠定了基础理论和实验依据.
In this paper, In2O3/SnO2 thin films deposited on the fabric for camouflage net are developed. Effect of the film thickness on the spectral reflective properties is investigated thoroughly. Results of the influence of the film thickness on the morphology and spectral properties are presented. Application of In2O3/SnO2 film in the infrared camouflage field is proposed.
出处
《物理学报》
SCIE
EI
CAS
CSCD
北大核心
2010年第1期541-544,共4页
Acta Physica Sinica
基金
国防预研究基金(批准号:ZLY2008415 )资助的课题~~
