晶粒尺寸对织构测试的影响与大晶粒薄带材样品的织构测试

Effect of Crystal Size on the Texture Measurement and One Solution of the Texture Measurement of the Thin Tape with Coarse-grains

通过比较不同晶粒尺寸立方系样品的极图测试结果，分析了样品晶粒尺寸对极图测试的影响。当样品晶粒细小时，可以用常规方法进行织构测试；对较大晶粒样品当测试谱线失去了对称性时或晶粒尺寸更大时，无法采用常规方式测试。对于因晶粒较大而无法采用常规织构测试的薄带材样品，通过从样品侧面测得不完全极图并经过ODF转换计算的方法可以得到样品的织构。结果表明，这种方法可以较好地解决大晶粒薄带材样品的织构测试问题。

The effect of the crystal size on the pole figure measurement （by X-ray diffraction）of cubic samples was analysis by comparing the pole figure measurement data of samples with different grain sizes. The normal X-ray texture measurement was suitable for samples with fine grain; as to the samples with very coarse-grains or it＇s pole figure lose the symmetrical, the texture measurement can not be taken by the normal way. For the thin tape samples with coarse-grains which can not take the pole figure measurement by the normal method, we tried to get the sample＇s incomplete pole figures on the resultant side faces and then by the way of the ODF transformation calculation to gain the samples texture information, and the result shows that the method is effective.