摘要
本文将在综述高分辨率定量电子显微学及相关技术发展现状的基础上,讨论材料结构和缺陷的原子尺度直接观察与计算机模拟对比研究的意义及影响高分辨率定量电子显微学测量结果的几种因素的研究现状。
出处
《电子显微学报》
CAS
CSCD
1998年第5期461-464,共4页
Journal of Chinese Electron Microscopy Society
同被引文献17
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