基于扩展单故障策略的多故障诊断算法

An Extended Single-Fault Algorithm for Multiple Fault Diagnosis

目前存在的测试性分析和故障诊断工具基本都是基于单故障假设,这一假设已经不适用于拥有很多元器件的复杂系统或者在运行过程中很少或不具备维修机会的系统。针对这一问题,研究了有效的基于扩展单故障策略的多故障序贯测试算法。该算法以最优单故障策略为基础,通过应用附加测试来隔离隐藏故障;通过更新故障状态集,重新调用单故障策略来隔离冒充故障。以某型机载电子设备为例给出实例分析,验证了该算法隔离隐藏故障和冒充故障的有效性。

Current testability analysis and fault diagnosis tools are basically based on single-fault assumption, which is not suitable for complex systems with large numbers of components and/or systems with little or no opportunity for maintenance during operation. Aiming at this point, a new multi-fault diagnosis algorithm based on extended single-fault strategy was studied. Based on optimal sequential testing algorithm for single fault, the strategy isolated hidden faults with additional tests. For masking faults, the strategy firstly updating failure state set and then invoked the single-fault diagnosis strategy to isolate them. Examples of diagnosing some real system on some active Spacecraft were given to demonstrate the strategy. It is concluded that the strategy can isolate hidden faults and masking faults effectively.