摘要
利用二次离子质谱(SIMS)并结合X射线衍射分析(XRD)研究了AlN陶瓷基板在850—1100℃空气中退火时的初始氧化行为.结果表明,未退火AlN陶瓷基板表面区存在很薄的富氧层.在退火10min的条件下,随着退火温度的增加,富氧层迅速增厚.在1100℃退火20min的条件下,AlN陶瓷基板表面区有连续的氧化层生成.最后,结合化学热力学,探讨了AlN陶瓷基板表面的初始氧化机理.
Secondary ion mass spectrometry (EIMS) and X -ray diffraction (XRD) measurement were employed to study the initial oxidation behavior of AlN ceramic substrate in air at 850—1 100 ℃. The results show that there is already a very thin oxygen_rich layer in the surface region of unannealed AlN ceramic substrate. When the sample is annealed for 10 minutes, the oxygen_rich layer becomes thicker rapidly with the increasing of annealing temperature. When it is annealed at 1 100 ℃ for 20 minutes, a continuous oxidic layer is formed. In the end, combined with chemical thermodynamics, the initial oxidation mechanism near the surface of AlN substrate is discussed.
出处
《硅酸盐学报》
EI
CAS
CSCD
北大核心
1998年第5期565-570,共6页
Journal of The Chinese Ceramic Society
基金
国家自然科学基金
关键词
氮化铝陶瓷
热氧化
二次离子质谱
陶瓷
aluminum nitride, ceramic, thermal oxidation, secondary ion mass spectrometry